Electron Microscopy Sciences 21 Semi Conductor Materials 32 mm Block

Electron Microscopy Sciences Mac has developed multi-element blocks of reference materials suitable for the compilation of a reference library of auger sensitivity factors when used with the auger electron microscopy (aes). A carefully selected range of elements or compounds will enable the surface analyst to compile a valuable reference library of spectra. A faraday cup, for the accurate measurement of specimen current, is available as an option. Multi-element blocks containing up to 50 reference materials can be made to suit the configuration of the most instrument. The reference material each has an exposed area about 2 square mm and are polished to a 1/4 micron diamond finish. The block of reference material is made from aisi 304 grade austenitic. All blocks are supplied with certificates of analysis. - EMS (Additional S&H or Hazmat Fees May Apply)