Electron Microscopy Sciences Silicon Nitride Lift-Out Tem Windows

Electron Microscopy Sciences Low-stress silicon nitride for lift-out tem window is large and robust with a freely suspended side along one length of the window. Providing an easily accessed edge for sample preparation and thinning to electron transparency (e.g. 50 Nm or less). The 100 micron thick frame and rounded half-grid shape fits flip-stage sem/fib holders and standard tem sample holders. - EMS