Electron Microscopy Sciences Quality Control Test Set B, 32 mm Ø X 8 mm

Electron Microscopy Sciences For scanning electron microscopes with energy dispersive or wavelength dispersive x-ray systems to check the performance and ensure performance is within the manufactures specification. Cobalt, compulsory for checking energy dispersive analyzers, and any other five selected standards* duplex brass for checking the contrast efficiency of back scattered detectors and detecting two major copper/zinc phases of 0.1 atomic number difference. A faraday cage for measuring the beam current at the specimen plane is in the center. S168t gold crystals on a carbon background for checking the performance of the sem at high-resolution with a finer than a 10 micron probe. S1930 silicon test specimen with squares of periodicity 9.9 micrometers lines about 1.9 micrometers is used for magnification calibration and assessing image distribution. *Excludes srm 481, srm 482 and srm 1872 - EMS