Electron Microscopy Sciences Model Mxs-301be Submicron Sem Std, Mounted

Electron Microscopy Sciences Ems offers a series of calibration standards with one and two dimension calibrated patterns. These standards are created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard. These reference standards are remarkably durable under typical operating conditions. The surface contamination behavior is also very good. There are no better sub-micron reference standard available in this price range. - EMS