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Electron Microscopy Sciences 1 Μm Specimen, Certified, Q Mount
List Price
$1,036.00
Your Price
$1,036.00
Electron Microscopy Sciences 1 µm Pitch Silicon Calibration Specimen, used with SEM, FIB, Sims, Auger, and LM. Made from Ultra-flat silicon, P Boron doped with a die size of 4 mm x 4 mm, calibration - EMS
NETA PART:
EMS-79505-12-Q
MFG.PART:
79505-12-Q
UNSPSC:
41116100
Manufacturer:
Electron Microscopy Sciences
Electron Microscopy Sciences 1 Μm pitch silicon calibration specimen, used with sem, fib, sims, auger, and lm. Made from ultra-flat silicon, p boron doped with a die size of 4 mm x 4 mm, calibration area of 3 mm x 3 mm and resistivity of 5-10 ohm/cm. For easy grid position finding it has an edge fiducial markers and unique serial number on each die for traceability. - EMS
| SKU | EMS-79505-12-Q |
|---|---|
| Supplier Part Number | 79505-12-Q |
| UM | EA |
| UNSPSC | 41116100 |
| Manufacturer | Electron Microscopy Sciences |
| CountryOfOrigin | United States |
| ProductLine | EMS |
| Qty | 1 |
| MinOrderQty | 1 |
| Weight | 0.100000 |
| Lead Time | 5 |
| Hazardous | N |
| Energy Star | No |
| Green | No |
| Controlled | N |