Electron Microscopy Sciences Calibration Standard Model 70-1d With Cert Mounted On Steel Disk For Afm

Electron Microscopy Sciences A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: silicon oxide ridges on silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. - EMS