Electron Microscopy Sciences 10 Μm Specimen, Traceable, Q Mount

List Price $176.96 Your Price $176.96
Electron Microscopy Sciences 10 µm Pitch Silicon Calibration Specimen, used with SEM, FIB, Sims, Auger, and LM. Made from Ultra-flat silicon, P Boron doped with a die size of 4 mm x 4 mm, calibratio - EMS
NETA PART: EMS-79505-21-Q
MFG.PART: 79505-21-Q
UNSPSC: 41116100
Manufacturer: Electron Microscopy Sciences
© 2025 Neta Scientific Incorporated ® | Terms and Conditions