Electron Microscopy Sciences Parallel Polishing Mount, 1/EA, Model 590 Tripod Polisher TEM SEM Sample Preparation

Electron Microscopy Sciences The tripod polisher is used to prepare accurately micro sizes of tem and sem samples. For tem samples, the tripod polisher iis used to limit ion milling times to less than 15 minutes, and in some cases, has eliminated the need for ion milling. It can be used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals, and geological specimens. It has limited ion milling requirements that reduce preferential thinning, radiation damage, and heating of the sample. No strong chemicals are used to prepare the specimen. - EMS