Electron Microscopy Sciences Specimen Lapping Kit

Electron Microscopy Sciences The model 160 specimen grinder is an accurate and dependable tool for mechanically prethinning specimens in preparation for transmission electron microscopy (tem). It greatly reduces the time spent during the final preparation process of ion beam milling. The grinder accommodates up to 18 mm diameter specimens. A graduated scale allows the specimen thickness to be easily and precisely controlled. The large diameter provides excellent stability. Specimens with uniform thickness and parallel sides are consistently produced because of the precise fit of the specimen platen into the grinder body. The grinder is heavy enough to provide sufficient grinding force on the specimen. The platen is transferable to the model 200 dimpling grinder. - EMS