Sigma-Aldrich Silicon Standard For Icp

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at https://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Silicon ICP standard can be used as a calibration standard in the determination of silicon concentration in organosilica materials by inductively coupled plasma optical emission spectroscopy (ICP-OES).[1]

1 g/L Si in 2% HNO₃ (contains HF traces), prepared with high purity Si, HNO₃, HF, and water

For a complete product listing of our TraceCERT^® range of CRMs for ICP and AAS, technical information and example certificates please visit our ICP & AAS standards website

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany